The ME100 is a x-ray spectrometric detector. The system is based on the innovative combination of a semiconductor crystal (CdTe/CZT), unique ASICs and high-speed front-end electronics capable of precisely measuring the energy of each incident X-ray photon.

The ME100 acquires the x-ray signature of each specific material in real time. The output of the system is based on a dedicated file format that allows to store a raw spectroscopic image.
The file starts with a header, followed by a the concatenation of the series of image data.

The Multix x-ray spectrometric detectors ME100 have been designed to be integrated into an equipment